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Journal of Applied Physics / Volume 97 / Issue 3 / NANOSCALE SCIENCE AND DESIGN

J. Appl. Phys. 97, 034311 (2005); http://dx.doi.org/10.1063/1.1845601 (4 pages)

Humidity sensing by fractally grown nanocomposites

B. N. Pal, S. Basu, and D. Chakravorty

Unit on Nanoscience and Technology, Indian Association for the Cultivation of Science, Kolkata-700 032, India

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(Received 14 September 2004; accepted 8 November 2004; published online 18 January 2005)

Fractal structure of α-iron was grown within gel-derived silica films. These were subjected to oxidation treatments at a temperature of 400 K for durations varying from 1 to 4 h. Nanoshells of Fe3O4 up to a thickness of 2 nm were formed in the process. The electrical resistivity of these nanocomposites was shown to arise due to a small polaron hopping mechanism between Fe2+ and Fe3+ sites. The nanocomposite films exhibited about three to four orders-of-magnitude resistivity change for an increase of relative humidity from 35% to 95%. The decrease was found to be exponential in nature and is believed to arise due to the injection of electrons to the oxide nanoshell.

© 2005 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. EXPERIMENT
  3. RESULTS AND DISCUSSION

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KEYWORDS and PACS

Keywords

silicon compounds, iron compounds, nanocomposites, humidity sensors, hygrometers, humidity measurement, oxidation, particle size, surface resistance, electrical resistivity, hopping conduction, thin films

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.1845601

PUBLICATION DATA

ISSN

0021-8979 (print)  
1089-7550 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    C. A. Grimes, D. Kouzoudis, E. C. Dickey, D. Qian, M. A. Anderson, R. Shahidam, M. Lindsey, and L. Green, J. Appl. Phys. 87, 5341 (2000)JAPIAU000087000009005341000001.

    C. Caliendo, I. Fratoddi, and M. V. Russo, Appl. Phys. Lett. 80, 4849 (2002)APPLAB000080000025004849000001.

    D. Das, M. Pal, E. Di Bartolomeo, E. Traversa, and D. Chakravorty, J. Appl. Phys. 88, 6856 (2000)JAPIAU000088000011006856000001.


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