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Journal of Applied Physics / Volume 96 / Issue 4 / PLASMAS AND ELECTRICAL DISCHARGES (PACS 51-52)

J. Appl. Phys. 96, 1835 (2004); doi:10.1063/1.1773923 (5 pages)

Two-dimensional space-time-resolved emission spectroscopy on atmospheric pressure glows in helium with impurities

C. Anderson, M. Hur, P. Zhang, L. Mangolini, and U. Kortshagen

Department of Mechanical Engineering, University of Minnesota, Minneapolis, Minnesota 55455

(Received 16 April 2004; accepted 25 May 2004)

The time dependence of the spectral emission of an atmospheric pressure glow discharge in helium with impurities has been studied with a two-dimensional spatial resolution. Emissions from He I (3s3S→2p3P:λ=706.5 nm) and N2(C3Πu→B3Πg:λ=337.1 nm) are used to qualitatively map the distributions of high- and low-energy electrons, respectively. The emission from N2+(B2∑u+→X2∑g+:λ=391.4 nm) provides qualitative information about the relative spatial distribution of He* metastable atoms within the discharge gap. The results demonstrate a radial spreading of the discharge during the current pulse as well as the formation of a ringlike, radially propagating cathode layer late in the current pulse.

© 2004 American Institute of Physics

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KEYWORDS and PACS

Keywords

helium, glow discharges, impurities, time resolved spectra, metastable states, plasma diagnostics

PACS

  • 52.80.Hc

    Glow; corona

  • 52.70.Kz

    Optical (ultraviolet, visible, infrared) measurements

  • 52.25.Os

    Emission, absorption, and scattering of electromagnetic radiation

ARTICLE DATA

Permalink
http://link.aip.org/link/doi/10.1063/1.1773923

PUBLICATION DATA

ISSN:

0021-8979 (print)  
1089-7550 (online)

Publisher:

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    F. Massines, A. Rabehi, P. Decomps, R. R. Gadri, P. Segur, and C. Mayoux, J. Appl. Phys. 83, 2950 (1998)JAPIAU000083000006002950000001.

    L. Mangolini, K. Orlov, U. Kortshagen, J. Heberlein, and U. Kogelschatz, Appl. Phys. Lett. 80, 1722 (2002)APPLAB000080000010001722000001.


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