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J. Appl. Phys. 96, 6908 (2004); http://dx.doi.org/10.1063/1.1815382 (4 pages)

High anisotropy of lateral alignment in multilayered (In,Ga)As∕GaAs(100) quantum dot structures

Zh. M. Wang, H. Churchill, C. E. George, and G. J. Salamo

Physics Department, University of Arkansas, Fayetteville, Arkansas 72701

(Received 26 April 2004; accepted 21 September 2004)

A formation process for long chains of quantum dots during the molecular-beam epitaxial growth of (In,Ga)As∕GaAs(100) multilayers is presented. The morphology evolution monitored by atomic force microscopy for a series of (In,Ga)As layers demonstrates that the highly anisotropic lateral alignment of dots is gradually developed as the result of the strain field interaction mediated by the GaAs spacer coupled with the anisotropic surface kinetics that occurs during capping the dots. The dot-chain structure, providing unique properties of its own, is demonstrated to serve as a template for the spatially controlled growth of strained quantum dots in general.

© 2004 American Institute of Physics

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KEYWORDS and PACS

PACS

  • 81.07.Ta

    Quantum dots

  • 68.65.Hb

    Quantum dots (patterned in quantum wells)

  • 81.05.Ea

    III-V semiconductors

  • 68.35.B-

    Structure of clean surfaces (and surface reconstruction)

  • 81.15.Hi

    Molecular, atomic, ion, and chemical beam epitaxy

  • 68.37.Ps

    Atomic force microscopy (AFM)

ARTICLE DATA

PUBLICATION DATA

ISSN

0021-8979 (print)  
1089-7550 (online)

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