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Journal of Applied Physics / Volume 93 / Issue 10 / Perpendicular Magnetic Recording IV: Media

J. Appl. Phys. 93, 8152 (2003); http://dx.doi.org/10.1063/1.1540160 (3 pages)

Effects of rapid thermal annealing on nanostructure, texture and magnetic properties of granular FePt:Ag films for perpendicular recording (invited)

Y. Shao, M. L. Yan, and D. J. Sellmyer

Center for Materials Research and Analysis and Department of Physics and Astronomy, University of Nebraska, Lincoln, Nebraska 68588-0113

We report effects of rapid thermal annealing on nanostructure, texture, and magnetic properties of granular FePt:Ag films. It was found that the orientations of FePt grains were dependent strongly on the as-deposited multilayer structure and the annealing processes. Through the control of the annealing processes, (001) textured L10 granular FePt:Ag films were obtained. Magnetic measurements revealed that saturation magnetization Ms, perpendicular coercivity Hc, and remanence ratio Mr/Ms, were also dependent on the annealing temperature, annealing time and Ag content. Perpendicular Hc values increased from 1.5 to 15 kOe when the annealing temperature changed from 400 to 600 °C for 600 s. Perpendicular Hc values remained about 11 kOe when the annealing time changed from 5 to 600 s. The effect of Ag content on magnetic properties is reported. © 2003 American Institute of Physics.

© 2003 American Institute of Physics

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KEYWORDS and PACS

Keywords

discontinuous metallic thin films, magnetic thin films, perpendicular magnetic recording, rapid thermal annealing, nanostructured materials, texture, magnetisation, coercive force, remanence, iron alloys, platinum alloys, silver

PACS

  • 75.70.Ak

    Magnetic properties of monolayers and thin films

  • 68.55.-a

    Thin film structure and morphology

  • 75.50.Ss

    Magnetic recording materials

  • 61.72.Cc

    Kinetics of defect formation and annealing

  • 75.50.Tt

    Fine-particle systems; nanocrystalline materials

  • 75.60.Ej

    Magnetization curves, hysteresis, Barkhausen and related effects

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.1540160

PUBLICATION DATA

ISSN

0021-8979 (print)  
1089-7550 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    H. Zeng, M. L. Yan, N. Powers, and D. J. Sellmyer, Appl. Phys. Lett. 80, 2350 (2002)APPLAB000080000013002350000001.

    C. P. Luo, S. H. Liou, and D. J. Sellmyer, J. Appl. Phys. 87, 6941 (2000)JAPIAU000087000009006941000001.

    D. H. Ping, M. Ohnuma, and K. Hono, J. Appl. Phys. 90, 4708 (2001)JAPIAU000090000009004708000001.

    S. Stavroyiannis, I. Panagiotopoulos, D. Niarchos, J. A. Christodoulides, Y. Zhang, and G. C. Hadjipanayis, Appl. Phys. Lett. 73, 3453 (1998)APPLAB000073000023003453000001.

    M. J. Yu, Y. Liu, A. Moser, D. Weller, and D. J. Sellmyer, Appl. Phys. Lett. 75, 3992 (1999)APPLAB000075000025003992000001.

    M. L. Yan, H. Zeng, N. Powers and D. J. Sellmyer, J. Appl. Phys. 91, 8471 (2002)JAPIAU000091000010008471000001.

    C. P. Luo, S. H. Liou, L. Gao, Y. Liu, and D. J. Sellmyer, Appl. Phys. Lett. 77, 2225 (2000)APPLAB000077000014002225000001.


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