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15 May 1998

Volume 83, Issue 10, pp. 5019-5595

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Scaling limit of digital circuits due to thermal noise

Kenji Natori and Nobuyuki Sano

J. Appl. Phys. 83, 5019 (1998); http://dx.doi.org/10.1063/1.367317 (6 pages) | Cited 3 times

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The error probability at a node of a digital circuit exposed to thermal noise agitation is investigated and the minimal dissipation–reliability relation for practical electronic circuits is derived. The digital circuit is modeled by an inverter chain with ideal transfer characteristics, and the error probability due to spurious data transfer caused by the thermal noise fluctuation is evaluated as a function of the node switching energy. The maximal error probability at each node allowed by the reliability requirement of the total system leads us to the minimal node energy dissipated per logical switching, which amounts to around 12 eV in the future 1010 gate system operated at a 10 GHz clock rate with a 104 FIT level reliability. In view of the device size-scaling trend of large-scale integrated circuits, the minimal node energy is expected to be reached at a feature size of 10–20 nm. © 1998 American Institute of Physics.
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85.40.Qx Microcircuit quality, noise, performance, and failure analysis
84.30.Sk Pulse and digital circuits
85.30.Tv Field effect devices
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Minimization of ion micromotion in a Paul trap

D. J. Berkeland, J. D. Miller, J. C. Bergquist, W. M. Itano, and D. J. Wineland

J. Appl. Phys. 83, 5025 (1998); http://dx.doi.org/10.1063/1.367318 (9 pages) | Cited 134 times

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Micromotion of ions in Paul traps has several adverse effects, including alterations of atomic transition line shapes, significant second-order Doppler shifts in high-accuracy studies, and limited confinement time in the absence of cooling. The ac electric field that causes the micromotion may also induce significant Stark shifts in atomic transitions. We describe three methods of detecting micromotion. The first relies on the change of the average ion position as the trap potentials are changed. The second monitors the amplitude of the sidebands of a narrow atomic transition, caused by the first-order Doppler shift due to the micromotion. The last technique detects the Doppler shift induced modulation of the fluorescence rate of a broad atomic transition. We discuss the detection sensitivity of each method to Doppler and Stark shifts, and show experimental results using the last technique.
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37.20.+j Atomic and molecular beam sources and techniques
32.60.+i Zeeman and Stark effects
32.70.Jz Line shapes, widths, and shifts
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