A computer‐aided analysis of the transport mechanism for holes in polycrystalline germanium films indicates that the density of dislocation lines obeys the relation
, and δD
are constants determined by experimental growth conditions. The film thickness is a
. The energy bands are bent down at each surface with uB
≃−10 and uS
≃−7 in accordance with the surface scattering theory developed by Schrieffer and Greene, Frankl, and Zemel.