• Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter iResearch App Facebook

J. Appl. Phys. 111, 104509 (2012); http://dx.doi.org/10.1063/1.4719046 (9 pages)

Dual roles of doping and trapping of semiconductor defect levels and their ramification to thin film photovoltaics

Ken K. Chin

Department of Physics and Apollo CdTe Solar Energy Research Center, New Jersey Institute of Technology, Newark, New Jersey 07102, USA

View MapView Map

(Received 6 March 2012; accepted 8 April 2012; published online 24 May 2012)

It is pointed out that the semiconductor localized intrinsic/impurity defect levels’ dual roles for carrier doping and trapping (Shockley-Read-Hall generation-recombination) have been treated differently and inconsistently. It is proposed that instead of ionization or activation energy, transition Gibbs free energy level should be used for the dual roles of doping-trapping. To qualitatively evaluate the effectiveness of doping and of trapping, the concept of doping efficacy ηd and two types of trapping efficacy ηt and ηSRH are proposed. The relationship of ηd, ηt, and ηSRH is formulated. Various values of ηSRH for different types of defect levels are presented. General ramification of the proposed concepts and efficacy of trapping is explored for polycrystalline thin film solar cells.

© 2012 American Institute of Physics

Article Outline

  1. CONSISTENT AND CORRECT TREATMENT OF SEMICONDUCTOR DEFECT LEVELS’ DUAL ROLES
  2. INTRODUCTION OF DOPING AND TRAPPING EFFICACIES OF A DEFECT TRANSITION LEVEL
  3. GENERAL RAMIFICATION OF EFFICACY OF THE SRH TRANSITION LEVEL TO PHOTOVOLTAICS
  4. CONCLUSION AND DISCUSSION

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS, PACS, and IPC

PACS

  • 71.55.Gs

    II-VI semiconductors

  • 73.50.Gr

    Charge carriers: generation, recombination, lifetime, trapping, mean free paths

  • 61.72.uj

    III-V and II-VI semiconductors

  • 88.40.jm

    Thin film III-V and II-VI based solar cells

  • 73.61.Ga

    II-VI semiconductors

International Patent Classification (IPC)

  • H01L21/02

    Manufacture or treatment of semiconductor devices or of parts thereof

  • H01L21/70

    Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in or on a common substrate or of specific parts thereof; Manufacture of integrated circuit devices or of specific parts thereof

  • H01L27/142

    Energy conversion devices

  • H01L31/04

    Adapted as conversion devices

  • H02N6/00

    Generators in which light radiation is directly converted into electrical energy

ARTICLE DATA

PUBLICATION DATA

ISSN

0021-8979 (print)  
1089-7550 (online)

For access to fully linked references, you need to log in.

    References

    K. Harafuji, T. Tsuchiya, and K. Kawamura, “Molecular dynamics simulation for evaluating melting point of wurtzite-type GaN crystal,” J. Appl. Phys. 96, 2501 (2004)JAPIAU000096000005002501000001.

    S.-H. Wei and S. B. Zhang, “Chemical trends of defect formation and doping limit in II-VI semiconductors: The case of CdTe,” Phys. Rev. B 66 155211 (2002).

    D. V. Lang, J. Appl. Phys. 45, 3023 (1974)JAPIAU000045000007003023000001.

    A. Yelon and B. Movaghar, “Microscopic explanation of the compensation (Myer-Neldel) rule,” Phys. Rev. Lett. 65(5), 618 (1990).

    D. Macdonald and L. J. Geerligs, “Recombination activity of interstitial iron and other transition metal point defects in p- and n-type crystalline silicon,” Appl. Phys. Lett. 85(18), 4061 (2004)APPLAB000085000018004061000001.

    J. Schmidt and D. Macdonald, “Recombination activity of iron-gallium and iron-indium pairs in silicon,” J. Appl. Phys. 97, 113712 (2005)JAPIAU000097000011113712000001.

    D. Debuf, “General theory of carrier lifetime in semiconductors with multiple localized states,” J. Appl. Phys. 96(11), 6454 (2004)JAPIAU000096000011006454000001.


For access to citing articles, you need to log in.


Figures (4)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)



Close
Google Calendar
ADVERTISEMENT

close