LOG IN or SELECT A PURCHASE OPTION:
J. Appl. Phys. 111, 104509 (2012); http://dx.doi.org/10.1063/1.4719046 (9 pages)
Dual roles of doping and trapping of semiconductor defect levels and their ramification to thin film photovoltaics
(Received 6 March 2012; accepted 8 April 2012; published online 24 May 2012)
© 2012 American Institute of Physics
Article Outline
- CONSISTENT AND CORRECT TREATMENT OF SEMICONDUCTOR DEFECT LEVELS’ DUAL ROLES
- INTRODUCTION OF DOPING AND TRAPPING EFFICACIES OF A DEFECT TRANSITION LEVEL
- GENERAL RAMIFICATION OF EFFICACY OF THE SRH TRANSITION LEVEL TO PHOTOVOLTAICS
- CONCLUSION AND DISCUSSION
RELATED DATABASES
KEYWORDS, PACS, and IPC
Keywords
cadmium compounds, deep level transient spectroscopy, electron traps, free energy, hole traps, II-VI semiconductors, ionisation, semiconductor doping, semiconductor thin films, solar cells
PACS
International Patent Classification (IPC)
Manufacture or treatment of semiconductor devices or of parts thereof
Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in or on a common substrate or of specific parts thereof; Manufacture of integrated circuit devices or of specific parts thereof
Energy conversion devices
Adapted as conversion devices
Generators in which light radiation is directly converted into electrical energy
ARTICLE DATA
References
K. Harafuji, T. Tsuchiya, and K. Kawamura, “Molecular dynamics simulation for evaluating melting point of wurtzite-type GaN crystal,” J. Appl. Phys. 96, 2501 (2004)JAPIAU000096000005002501000001.S.-H. Wei and S. B. Zhang, “Chemical trends of defect formation and doping limit in II-VI semiconductors: The case of CdTe,” Phys. Rev. B 66 155211 (2002).
D. V. Lang, J. Appl. Phys. 45, 3023 (1974)JAPIAU000045000007003023000001.
A. Yelon and B. Movaghar, “Microscopic explanation of the compensation (Myer-Neldel) rule,” Phys. Rev. Lett. 65(5), 618 (1990).
D. Macdonald and L. J. Geerligs, “Recombination activity of interstitial iron and other transition metal point defects in p- and n-type crystalline silicon,” Appl. Phys. Lett. 85(18), 4061 (2004)APPLAB000085000018004061000001.
J. Schmidt and D. Macdonald, “Recombination activity of iron-gallium and iron-indium pairs in silicon,” J. Appl. Phys. 97, 113712 (2005)JAPIAU000097000011113712000001.
D. Debuf, “General theory of carrier lifetime in semiconductors with multiple localized states,” J. Appl. Phys. 96(11), 6454 (2004)JAPIAU000096000011006454000001.
For access to citing articles, you need to log in.
Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)
















This Publication
Scitation
Google Scholar
PubMed