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Journal of Applied Physics / Volume 110 / Issue 12 / ARTICLES / Interdisciplinary and General Physics

J. Appl. Phys. 110, 124908 (2011); http://dx.doi.org/10.1063/1.3665646 (13 pages)

Depth-profiling of elastic and optical inhomogeneities in transparent materials by picosecond ultrasonic interferometry: Theory

V. Gusev1, A. M. Lomonosov2, P. Ruello1, A. Ayouch1, and G. Vaudel1

1LPEC, UMR-CNRS 6087, Université du Maine, av. O. Messiaen, 72085 Le Mans, France
2Prokhorov General Physics Institute, RAS, 119991 Moscow, Russian Federation

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(Received 10 June 2011; accepted 5 November 2011; published online 20 December 2011)

The theoretical backgrounds for the depth-profiling of the optically transparent materials by picosecond ultrasonic interferometry are developed. The mathematical description of the light reflection from inhomogeneous transparent films or coatings is proposed. The inhomogeneity can be caused both by the film synthesis (intrinsic stationary inhomogeneity) and by the short acoustic transients launched in the film (time-dependent inhomogeneity). The theory indicates that the measurements of the complex optical reflectivity time evolution, caused by acoustic strain pulse propagation in such films, offer various possibilities to extract the depth profiles of intrinsic inhomogeneous distributions of mechanical/acoustical, optical, and acousto-optical parameters of the films. In particular it is proposed how the measurements of the transient complex optical reflectivity by the femtosecond optical interferometers, operating with light of different polarizations and probing the tested samples at different angles of light incidence, can be used. The spatial resolution of the method is limited by the acoustic spatial scale which, for picosecond acoustic pulses, is much shorter than optical wavelength.

© 2011 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. THEORY
    1. Transient optical reflectivity
    2. Propagation of the picosecond acoustic pulses
    3. Acousto-optic depth profiling
  3. DISCUSSION
    1. Oblique probe light incidence
    2. p -polarized probe light
    3. Processing of the simulated experimental data
  4. CONCLUSIONS

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KEYWORDS and PACS

Keywords

acousto-optical effects, high-speed optical techniques, light polarisation, light reflection, reflectivity, transparency

PACS

  • 78.20.Ci

    Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)

  • 78.47.J-

    Ultrafast spectroscopy (<1 psec)

  • 78.20.hb

    Piezo-optical, elasto-optical, acousto-optical, and photoelastic effects

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3665646

PUBLICATION DATA

ISSN

0021-8979 (print)  
1089-7550 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    T. Kim,1 N. Tsuji, K. Matsushita, N. Kobayashi, D. Chumakov, H. Geisler, E. Zschech, and R. H. Dauskardt, J. Appl. Phys. 104, 074113 (2008)JAPIAU000104000007074113000001.

    C. Mechri, P. Ruello, J. M. Breteau, M. R. Baklanov, P. Verdonck, and V. Gusev, Appl. Phys. Lett. 95, 091907 (2009)APPLAB000095000009091907000001.

    H.-N. Lin, R. J. Stoner, H. J. Maris, and J. Tauc, J. Appl. Phys. 69, 3816 (1991)JAPIAU000069000007003816000001.

    O. Matsuda, O. B. Wright, D. H. Hurley, V. Gusev, and K. Shimizu, Phys. Rev. B 77, 224110 (2008).

    A. Devos, R. Cote, G. Caruyer, and A. Lefevre, Appl. Phys. Lett. 86, 211903 (2005)APPLAB000086000021211903000001.

    P. Emery and A. Devos, Appl. Phys. Lett. 89, 191904 (2006)APPLAB000089000019191904000001.

    S. A. Akhmanov and V. E. Gusev, Sov. Phys. Usp. 35, 153 (1992)SOPUAP000035000003000153000001.

    V. Gusev and O. B. Wright, Phys. Rev. B 57, 2878 (1998).

    N. V. Chigarev, D. Yu. Paraschuk, X. Y. Pan, and V. E. Gusev, Phys. Rev. B 61, 15837 (2000).

    B. C. Forget, D. Fournier, and V. E. Gusev, Appl. Phys. Lett. 61, 2341 (1992)APPLAB000061000019002341000001.

    O. Matsuda and O. B. Wright, Rev. Sci. Instrum. 74, 895 (2003)RSINAK000074000001000895000001.


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