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Journal of Applied Physics / Volume 108 / Issue 6 / ARTICLES / Interdisciplinary and General Physics

J. Appl. Phys. 108, 064911 (2010); http://dx.doi.org/10.1063/1.3480996 (6 pages)

Time-resolved x-ray diffraction study of the piezoelectric crystal response to a fast change of an applied electric field

Semen Gorfman1, Oleg Schmidt2, Michael Ziolkowski2, Marc von Kozierowski2, and Ullrich Pietsch2

1Department of Physics, University of Warwick, CV4 7AL, Coventry, United Kingdom
2Depatment of Physics, University of Siegen, D57072, Siegen, Germany

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(Received 4 March 2010; accepted 20 July 2010; published online 28 September 2010)

Time-resolved measurements of the macroscopic and microscopic strains in piezoelectric crystals were performed with a novel data acquisition technique implemented on the basis of a field programmed gate array system. Both types of strains were induced in a crystal by an applied periodic high voltage with fast (within 100 ns) switches between opposite polarities and measured simultaneously by respective angular shifts and integrated intensities of synchrotron x-ray diffraction rocking curves. The time resolution achieved with the developed data acquisition system was 100 ns. The paper demonstrates the particular application of this technique for the investigations of time dynamics of lattice constants and atomic positions in a unit cell for piezoelectric BiB3O6 and Li2SO4⋅H2O crystals. It has been found that 100 ns fast rising time of an applied external electric field induces oscillations of the crystal lattice constants, visible as oscillations of Bragg peak angular positions. At the same time, these oscillations are not observed for the Bragg intensities, i.e., for fractional positions of atoms in the unit cell and correspondingly for bond lengths. The results allow suggesting a model for the mutual interconnection between the deformation of bond lengths and lattice constants in piezoelectric crystals.

© 2010 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. FIELD PROGRAMMABLE GATE ARRAY (FPGA)-BASED EXPERIMENTAL TECHNIQUE FOR THE TIME-RESOLVED X-RAY MEASUREMENTS
  3. INVESTIGATION OF THE PIEZOELECTRIC RESPONSE IN LI2SO4⋅H2O CRYSTAL
  4. THE OBSERVED STATIC AND DYNAMIC PHYSICAL PROPERTIES IN TERMS OF A HARMONIC OSCILLATOR
  5. DISCUSSION
  6. CONCLUSION

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KEYWORDS and PACS

Keywords

bismuth compounds, bond lengths, deformation, lattice constants, lithium compounds, piezoelectric materials, X-ray diffraction

PACS

  • 77.65.Ly

    Strain-induced piezoelectric fields

  • 81.40.Lm

    Deformation, plasticity, and creep

  • 62.20.F-

    Deformation and plasticity

  • 61.66.Fn

    Inorganic compounds

  • 77.84.Bw

    Elements, oxides, nitrides, borides, carbides, chalcogenides, etc.

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3480996

PUBLICATION DATA

ISSN

0021-8979 (print)  
1089-7550 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    J. Stahn, U. Pietsch, P. Blaha, and K. Schwarz, Phys. Rev. B 63, 165205 (2001).

    S. J. van Reeuwijk, A. Puig-Molina, O. Mathon, R. Tucoulou, and H. Graafsma, J. Appl. Phys. 94, 6708 (2003)JAPIAU000094000010006708000001.


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