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J. Appl. Phys. 108, 051101 (2010); http://dx.doi.org/10.1063/1.3474652 (20 pages)
High aspect ratio silicon etch: A review
(Received 4 November 2009; accepted 12 July 2010; published online 9 September 2010; corrected 10 September 2010)
© 2010 American Institute of Physics
Article Outline
- INTRODUCTION TO HIGH ASPECT RATIO SILICON ETCH
- Wet etch
- Plasma etch
- Etch and passivation
- Microelectromechanical systems (MEMS)
- TSVs
- HAR small features for IC fabrications
- Challenges of HAR silicon etch
- TIME-MULTIPLEXED ALTERNATING PROCESS
- Etch rate
- Etch rate uniformity
- Selectivity
- Profile
- ARDE
- Loading effects
- Micrograss
- Notching
- STEADY-STATE ETCH PROCESSES
- RIE
- Cryogenic etching
- Near-room temperature high density plasma (HDP) etch
- ETCH METHOD AND EQUIPMENT
- THEORETICAL ANALYSIS
- Thermodynamics
- Kinetics
- CONCLUSIONS
RELATED DATABASES
KEYWORDS and PACS
Keywords
elemental semiconductors, passivation, silicon, sputter etching
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