jap banner
  • Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter UniPHY Group iResearch App Facebook

Journal of Applied Physics / Volume 108 / Issue 4 / ARTICLES / Lasers, Optics, and Optoelectronics

J. Appl. Phys. 108, 043106 (2010); http://dx.doi.org/10.1063/1.3474651 (6 pages)

Detection of concealed and buried chemicals by using multifrequency excitations

Yaohui Gao1, Meng-Ku Chen1, Chia-En Yang1, Yun-Ching Chang1, Jim Yao1, Jiping Cheng1, Stuart Yin1, Rongqing Hui2, Paul Ruffin3, Christina Brantley3, Eugene Edwards3, and Claire Luo4

1Department of Electrical Engineering, Pennsylvania State University, University Park, Pennsylvania 16802, USA
2Department of Electrical Engineering and Computer Science, The University of Kansas, Lawrence, Kansas 66045, USA
3US Army Aviation and Missile Research Development and Engineering Center Redstone Arsenal, Alabama 35898, USA
4General Opto Solutions, LLC State College, Pennsylvania 16803, USA

View MapView Map

(Received 2 March 2010; accepted 30 June 2010; published online 25 August 2010)

In this paper, we present a new type of concealed and buried chemical detection system by stimulating and enhancing spectroscopic signatures with multifrequency excitations, which includes a low frequency gradient dc electric field, a high frequency microwave field, and higher frequency infrared (IR) radiations. Each excitation frequency plays a unique role. The microwave, which can penetrate into the underground and/or pass through the dielectric covers with low attenuation, could effectively transform its energy into the concealed and buried chemicals and increases its evaporation rate from the sample source. Subsequently, a gradient dc electric field, generated by a Van De Graaff generator, not only serves as a vapor accelerator for efficiently expediting the transportation process of the vapor release from the concealed and buried chemicals but also acts as a vapor concentrator for increasing the chemical concentrations in the detection area, which enables the trace level chemical detection. Finally, the stimulated and enhanced vapors on the surface are detected by the IR spectroscopic fingerprints. Our theoretical and experimental results demonstrate that more than sixfold increase in detection signal can be achieved by using this proposed technology. The proposed technology can also be used for standoff detection of concealed and buried chemicals by adding the remote IR and/or thermal spectroscopic and imaging detection systems.

© 2010 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. THEORY
  3. SIMULATION
  4. EXPERIMENT
  5. CONCLUSION

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS and PACS

Keywords

dielectric materials, infrared spectroscopy, van de Graaff accelerators

PACS

  • 29.20.Ba

    Electrostatic accelerators

  • 07.57.Ty

    Infrared spectrometers, auxiliary equipment, and techniques

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3474651

PUBLICATION DATA

ISSN

0021-8979 (print)  
1089-7550 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.

Figures (6)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)



Close

Google Calendar

ADVERTISEMENT

Your Recent History Recent History Help

Recently Viewed

  1. Detection of concealed and buried chemicals by using multifrequency excitations
  2. Intense whole area electroluminescence from low pressure chemical vapor deposition-silicon-rich oxide based light emitting capacitors
  3. Modeling high power light-emitting diode spectra and their variation with junction temperature
  4. ZnO-organic hybrid white light emitting diodes grown on flexible plastic using low temperature aqueous chemical method
  5. Enhancement of photovoltaic cell response due to high-refractive-index encapsulants
Go to AIP Home
Copyright © American Institute of Physics
close