Piezoresponse force microscopy investigations of Aurivillius phase thin films

Keeney, Lynette; Zhang, Panfeng F.; Groh, Claudia; Pemble, Martyn E.; Whatmore, Roger W.

doi:doi:10.1063/1.3474959

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Drive frequency dependent phase imaging in piezoresponse force microscopy

The drive frequency dependent piezoresponse (PR) phase signal in near-stoichiometric lithium niobate crystals is studied by piezoresponse force microscopy. It is clearly shown that the local and nonlocal electrostatic forces have a great contribution to the PR phase signal. The significant PR phase difference of the antiparallel domains are observed at the contact resonances, which is related to the electrostatic dominated electromechanical interactions of the cantilever and tip-sample system. ...

Individual switching of film-based nanoscale epitaxial ferroelectric capacitors

We have investigated the individual switching of nanoscale capacitors by piezoresponse force microscopy. Nanoscale epitaxial ferroelectric capacitors with terabyte per inch square equivalent density were fabricated by the deposition of top electrodes onto a pulsed laser deposited lead zirconate titanate thin film by electron beam evaporation through ultrathin anodic aluminum oxide membrane stencil masks. Using bias pulses, the nanoscale capacitors were uniformly switched and proved to be indivi...

The sol-gel synthesis and characterization of n ≥ 3 Aurivillius phase thin films deposited on Pt/Ti/SiO₂–Si substrates is described. The number of perovskite layers, n, was increased by inserting BiFeO₃ into three layered Aurivillius phase Bi₄Ti₃O₁₂ to form compounds such as Bi₅FeTi₃O₁₅ (n = 4). 30% of the Fe³⁺ ions in Bi₅FeTi₃O₁₅ were substituted with Mn³⁺ ions to form the structure Bi₅Ti₃Fe_0.7Mn_0.3O₁₅. The electromechanical responses of the materials were investigated using piezoresponse force microscopy and the results are discussed in relation to the crystallinity of the films as measured by x-ray diffraction.

Article Outline

INTRODUCTION
EXPERIMENTAL
RESULTS AND DISCUSSION
1. Crystal structure
2. Surface morphology
3. Piezoelectric properties
CONCLUSIONS

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KEYWORDS and PACS

Keywords

bismuth compounds, electromechanical effects, iron compounds, piezoelectric materials, sol-gel processing, thin films, titanium compounds, X-ray diffraction

PACS

68.55.A-

Nucleation and growth
77.84.-s

Dielectric, piezoelectric, ferroelectric, and antiferroelectric materials
77.65.-j

Piezoelectricity and electromechanical effects

ARTICLE DATA

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http://dx.doi.org/10.1063/1.3474959

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0021-8979 (print)

1089-7550 (online)

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American Institute of Physics

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