Drive frequency dependent phase imaging in piezoresponse force microscopy

Bo, Huifeng; Kan, Yi; Lu, Xiaomei; Liu, Yunfei; Peng, Song; Wang, Xiaofei; Cai, Wei; Xue, Ruoshi; Zhu, Jinsong

doi:doi:10.1063/1.3474956

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Lateral piezoelectric response across ferroelectric domain walls in thin films

In purely c-axis oriented PbZr0.2Ti0.8O3 ferroelectric thin films, a lateral piezoresponse force microscopy signal is observed at the position of 180° domain walls, where the out-of-plane oriented polarization is reversed. Using electric force microscopy measurements we exclude electrostatic effects as the origin of this signal. Moreover, our mechanical simulations of the tip/cantilever system show that the small tilt of the surface at the domain wall below the tip does not satisfactorily expla...

Piezoresponse force microscopy investigations of Aurivillius phase thin films

The sol-gel synthesis and characterization of n ≥ 3 Aurivillius phase thin films deposited on Pt/Ti/SiO2–Si substrates is described. The number of perovskite layers, n, was increased by inserting BiFeO3 into three layered Aurivillius phase Bi4Ti3O12 to form compounds such as Bi5FeTi3O15 (n = 4). 30% of the Fe3+ ions in Bi5FeTi3O15 were substituted with Mn3+ ions to form the structure Bi5Ti3Fe0.7Mn0.3O15. The electromechanical responses of the materials were investigated using piezoresponse forc...

The drive frequency dependent piezoresponse (PR) phase signal in near-stoichiometric lithium niobate crystals is studied by piezoresponse force microscopy. It is clearly shown that the local and nonlocal electrostatic forces have a great contribution to the PR phase signal. The significant PR phase difference of the antiparallel domains are observed at the contact resonances, which is related to the electrostatic dominated electromechanical interactions of the cantilever and tip-sample system. Moreover, the modulation voltage induced frequency shift at higher eigenmodes could be attributed to the change of indention force depending on the modulation amplitude with a piezoelectric origin. The PR phase of the silicon wafer is also measured for comparison. It is certificated that the electrostatic interactions are universal in voltage modulated scanning probe microscopy and could be extended to other phase imaging techniques.

Article Outline

INTRODUCTION
EXPERIMENTAL PROCEDURE
RESULTS AND DISCUSSION
CONCLUSIONS

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KEYWORDS and PACS

Keywords

eigenvalues and eigenfunctions, piezoelectricity, X-ray imaging

PACS

07.85.-m

X- and γ-ray instruments
02.10.Ud

Linear algebra

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Digital Object Identifier

http://dx.doi.org/10.1063/1.3474956

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0021-8979 (print)

1089-7550 (online)

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American Institute of Physics

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