Correlation of electron backscatter diffraction and piezoresponse force microscopy for the nanoscale characterization of ferroelectric domains in polycrystalline lead zirconate titanate

Burnett, T. L.; Weaver, P. M.; Blackburn, J. F.; Stewart, M.; Cain, M. G.

doi:doi:10.1063/1.3474940

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Preface to Special Topic: Invited Papers from the International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, Aveiro, Portugal, 2009

Lateral piezoelectric response across ferroelectric domain walls in thin films

In purely c-axis oriented PbZr0.2Ti0.8O3 ferroelectric thin films, a lateral piezoresponse force microscopy signal is observed at the position of 180° domain walls, where the out-of-plane oriented polarization is reversed. Using electric force microscopy measurements we exclude electrostatic effects as the origin of this signal. Moreover, our mechanical simulations of the tip/cantilever system show that the small tilt of the surface at the domain wall below the tip does not satisfactorily expla...

The functional properties of ferroelectric ceramic bulk or thin film materials are strongly influenced by their nanostructure, crystallographic orientation, and structural geometry. In this paper, we show how, by combining textural analysis, through electron backscattered diffraction, with piezoresponse force microscopy, quantitative measurements of the piezoelectric properties can be made at a scale of 25 nm, smaller than the domain size. The combined technique is used to obtain data on the domain-resolved effective single crystal piezoelectric response of individual crystallites in Pb(Zr_0.4Ti_0.6)O₃ ceramics. The results offer insight into the science of domain engineering and provide a tool for the future development of new nanostructured ferroelectric materials for memory, nanoactuators, and sensors based on magnetoelectric multiferroics.

Article Outline

INTRODUCTION
EXPERIMENTAL PROCEDURE
MODEL DESCRIPTION
RESULTS AND DISCUSSION
1. EBSD results
2. PFM results
3. Model results
4. Discussion of results
CONCLUSIONS

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KEYWORDS and PACS

Keywords

electric domains, electron backscattering, electron diffraction, ferroelectric ceramics, ferroelectric thin films, lead compounds, nanostructured materials, piezoelectricity, titanium compounds, zirconium compounds

PACS

77.80.Dj

Domain structure; hysteresis
61.46.-w

Structure of nanoscale materials
79.20.Kz

Other electron-impact emission phenomena
68.49.Jk

Electron scattering from surfaces
77.84.-s

Dielectric, piezoelectric, ferroelectric, and antiferroelectric materials
77.55.H-

Piezoelectric and electrostrictive films

ARTICLE DATA

Digital Object Identifier

http://dx.doi.org/10.1063/1.3474940

PUBLICATION DATA

ISSN

0021-8979 (print)

1089-7550 (online)

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American Institute of Physics

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