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Journal of Applied Physics / Volume 108 / Issue 4 / SPECIAL TOPIC: INVITED PAPERS FROM THE INTERNATIONAL SYMPOSIUM ON PIEZORESPONSE FORCE MICROSCOPY AND NANOSCALE PHENOMENA IN POLAR MATERIALS, AVEIRO, PORTUGAL, 2009
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J. Appl. Phys. 108, 041901 (2010); doi:10.1063/1.3474648 (2 pages)

Preface to Special Topic: Invited Papers from the International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, Aveiro, Portugal, 2009

Sergei V. Kalinin1, Nava Setter2, and Andrei L. Kholkin3

1The Center for Nanophase Materials Sciences and Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831-6030, USA
2Ceramics Laboratory, Swiss Federal Institute of Technology (EPFL), 1015 Lausanne, Switzerland
3Department of Ceramic and Glass Engineering and CICECO, University of Aveiro, 3810-193 Aveiro, Portugal

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(Received 28 June 2010; published online 31 August 2010)

Abstract unavailable.

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KEYWORDS and PACS

Keywords

atomic force microscopy, dielectric hysteresis, electric domain walls, electrochemistry, piezoelectricity, relaxor ferroelectrics

PACS

  • 77.80.Dj

    Domain structure; hysteresis

  • 68.37.Ps

    Atomic force microscopy (AFM)

  • 82.45.-h

    Electrochemistry and electrophoresis

  • 77.80.Jk

    Relaxor ferroelectrics

  • 77.65.-j

    Piezoelectricity and electromechanical effects

ARTICLE DATA

Permalink
http://link.aip.org/link/doi/10.1063/1.3474648

PUBLICATION DATA

ISSN:

0021-8979 (print)  
1089-7550 (online)

Publisher:

$abstract.society.value is a Member of CrossRef American Institute of Physics

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