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Journal of Applied Physics / Volume 107 / Issue 9 / ARTICLES / Structural, Mechanical, Thermodynamic, and Optical Properties of Condensed Matter

J. Appl. Phys. 107, 093503 (2010); http://dx.doi.org/10.1063/1.3400130 (7 pages)

Size dependent strengthening mechanisms in sputtered Fe/W multilayers

Nan Li1, K. Y. Yu1, J. Lee2, H. Wang2, and X. Zhang1

1Department of Mechanical Engineering, Materials Science and Engineering Program, Texas A&M University, College Station, Texas 77843-3123, USA
2Department of Electrical and Computer Engineering, Texas A&M University, College Station, Texas 77843-3128, USA

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(Received 30 January 2010; accepted 21 March 2010; published online 3 May 2010)

We investigate size dependent strengthening mechanisms in sputtered Fe/W multilayers with individual layer thickness, h, varying from 1 to 200 nm. Microstructure analyses reveal that Fe/W has incoherent bcc/bcc interface when h is greater than 5 nm. When h decreases to 1–2.5 nm, the interface becomes semicoherent, and Fe and W show significant lattice distortions comparing to their bulk counterpart due to interface constraint. The layer thickness dependent drastic variations in x-ray diffraction profiles are simulated well by using an analytical model. Film hardness increases with decreasing h, and approaches a maximum value of 12.5 GPa when h is 1 nm. The layer thickness dependent film hardnesses are compared with analytical models. Koehler’s image force plays a major role in determining the maximum strength of composites at smaller h.

© 2010 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. EXPERIMENT
  3. RESULTS
  4. DISCUSSIONS
    1. Microstructure of Fe/W multilayer films
    2. Mechanical properties—Fe/W interface induced hardening
  5. CONCLUSIONS

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KEYWORDS and PACS

Keywords

crystal microstructure, distortion, hardness, interface structure, iron, mechanical strength, metallic thin films, multilayers, sputtered coatings, tungsten, X-ray diffraction

PACS

  • 68.60.Bs

    Mechanical and acoustical properties

  • 68.55.-a

    Thin film structure and morphology

  • 68.35.Ct

    Interface structure and roughness

  • 62.20.Qp

    Friction, tribology, and hardness

  • 81.40.Np

    Fatigue, corrosion fatigue, embrittlement, cracking, fracture, and failure

  • 81.05.Bx

    Metals, semimetals, and alloys

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3400130

PUBLICATION DATA

ISSN

0021-8979 (print)  
1089-7550 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
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    V. Iota, J. P. Klepeis, C. S. Yoo, J. Lang, D. Haskel, and G. Srajer, Appl. Phys. Lett. 90, 042505 (2007)APPLAB000090000004042505000001.

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