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Journal of Applied Physics / Volume 107 / Issue 2 / ARTICLES / Electronic Structure and Transport

J. Appl. Phys. 107, 023704 (2010); http://dx.doi.org/10.1063/1.3272882 (5 pages)

Investigation of the internal electric field in cadmium zinc telluride detectors using the Pockels effect and the analysis of charge transients

Michael Groza1, Henric Krawczynski2, Alfred Garson2, Jerrad W. Martin2, Kuen Lee2, Qiang Li2, Matthias Beilicke2, Yunlong Cui1, Vladimir Buliga1, Mingsheng Guo1, Constantine Coca1, and Arnold Burger1

1Department of Physics, Fisk University, 1000 17th Ave., Nashville, Tennessee 37208, USA
2Department of Physics and Astronomy, Washington University in St. Louis, 1 Brookings Dr., CB 1105, St. Louis, Missouri 61130, USA

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(Received 29 September 2009; accepted 11 November 2009; published online 22 January 2010)

The Pockels electro-optic effect can be used to investigate the internal electric field in cadmium zinc telluride (CZT) single crystals that are used to fabricate room temperature x and gamma radiation detectors. An agreement is found between the electric field mapping obtained from Pockels effect images and the measurements of charge transients generated by alpha particles. The Pockels effect images of a CZT detector along two mutually perpendicular directions are used to optimize the detector response in a dual anode configuration, a device in which the symmetry of the internal electric field with respect to the anode strips is of critical importance. The Pockels effect is also used to map the electric field in a CZT detector with dual anodes and an attempt is made to find a correlation with the simulated electric potential in such detectors. Finally, the stress-induced birefringence effects seen in the Pockels images are presented and discussed.

© 2010 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. MEASUREMENT AND ANALYSIS METHODS
  3. EXPERIMENTAL RESULTS
  4. CONCLUSIONS

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KEYWORDS and PACS

Keywords

birefringence, cadmium compounds, electric field effects, electrochemical electrodes, gamma-ray detection, II-VI semiconductors, Pockels effect, semiconductor counters, X-ray detection, zinc compounds

PACS

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3272882

PUBLICATION DATA

ISSN

0021-8979 (print)  
1089-7550 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

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    References

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