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Journal of Applied Physics / Volume 106 / Issue 1 / STRUCTURAL, MECHANICAL, THERMODYNAMIC, AND OPTICAL PROPERTIES OF CONDENSED MATTER

J. Appl. Phys. 106, 013508 (2009); http://dx.doi.org/10.1063/1.3158360 (7 pages)

Self-lubricating carbon nanotube reinforced nickel matrix composites

T. W. Scharf1, A. Neira1, J. Y. Hwang1, J. Tiley2, and R. Banerjee1

1Department of Materials Science and Engineering and Center for Advanced Research and Technology, University of North Texas, Denton, Texas 76203-5017, USA
2Materials and Manufacturing Directorate, Air Force Research Laboratory, WPAFB, Dayton, Ohio 45309, USA

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(Received 15 January 2009; accepted 30 May 2009; published online 8 July 2009)

Nickel (Ni)—multiwalled carbon nanotube (CNT) composites have been processed in a monolithic form using the laser-engineered net shape (LENS™) processing technique. Auger electron spectroscopy maps determined that the nanotubes were well dispersed and bonded in the nickel matrix and no interfacial chemical reaction products were determined in the as-synthesized composites. Mechanisms of solid lubrication have been investigated by micro-Raman spectroscopy spatial mapping of the worn surfaces to determine the formation of tribochemical products. The Ni-CNT composites exhibit a self-lubricating behavior, forming an in situ, low interfacial shear strength graphitic film during sliding, resulting in a decrease in friction coefficient compared to pure Ni.

© 2009 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. EXPERIMENTAL DETAILS
  3. RESULTS AND DISCUSSION
    1. As-synthesized Composite (Ni-CNT interface)
    2. Friction and wear behavior
    3. Structural modification and tribochemical reactions
  4. CONCLUSIONS

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KEYWORDS and PACS

Keywords

Auger electron spectra, carbon nanotubes, composite materials, friction, laser materials processing, lubrication, nickel, Raman spectra, shear strength, wear

PACS

  • 81.40.Pq

    Friction, lubrication, and wear

  • 81.20.-n

    Methods of materials synthesis and materials processing

  • 62.20.Qp

    Friction, tribology, and hardness

  • 78.30.Am

    Elemental semiconductors and insulators

  • 82.80.Pv

    Electron spectroscopy (X-ray photoelectron (XPS), Auger electron spectroscopy (AES), etc.)

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3158360

PUBLICATION DATA

ISSN

0021-8979 (print)  
1089-7550 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

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    References

    T. W. Scharf, R. D. Ott, D. Yang, and J. A. Barnard, J. Appl. Phys. 85, 3142 (1999)JAPIAU000085000006003142000001.


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