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J. Appl. Phys. 105, 114908 (2009); doi:10.1063/1.3131844 (9 pages)

Analysis of radio-frequency absorption and electric and magnetic field enhancements due to surface roughness

Peng Zhang, Y. Y. Lau, and R. M. Gilgenbach

Department of Nuclear Engineering and Radiological Sciences, University of Michigan, Ann Arbor, Michigan 48109-2104, USA

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(Received 20 February 2009; accepted 14 April 2009; published online 4 June 2009)

The radio-frequency (rf) power absorption due to a small hemispherical protrusion on a resonant cavity’s surface is computed analytically. This protrusion may assume arbitrary values of permittivity, permeability, and conductivity so that it may represent a foreign object. Under the assumption that the protrusion radius, a, is small compared with the rf wavelength, the power dissipated in the protrusion by the rf electric field and by the rf magnetic field are calculated explicitly. It is found that, in general, the heating by the rf magnetic field is dominant when δ/a<1, even for nonmagnetic materials, where δ is the skin depth associated with the protrusion material. The field enhancement factors for both the rf electric field and the rf magnetic field on the protrusion are also calculated analytically. They are found to decrease as δ/a increases. They are spot checked against the MAXWELL 3D code. These field enhancement factors are also consistent with the published results in the δ = 0 limit, in which case the protrusion may represent a small local bump on the surface of a superconducting cavity.

© 2009 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. THE MODEL
  3. rf POWER ABSORPTION
  4. rf FIELD ENHANCEMENTS
    1. rf electric field enhancement
    2. rf magnetic field enhancement
  5. CONCLUDING REMARKS

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KEYWORDS and PACS

PACS

  • 78.70.Gq

    Microwave and radio-frequency interactions

  • 03.50.De

    Classical electromagnetism, Maxwell equations

  • 77.22.Ch

    Permittivity (dielectric function)

  • 68.35.bt

    Other materials

PUBLICATION DATA

ISSN:

0021-8979 (print)  
1089-7550 (online)

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