• Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter UniPHY Group iResearch App Facebook

J. Appl. Phys. 102, 043902 (2007); http://dx.doi.org/10.1063/1.2769807 (4 pages)

Characteristic temperatures of exchange biased systems

A. N. Dobrynin and R. Prozorov

Ames Laboratory and Department of Physics and Astronomy, Iowa State University, Ames, Iowa 50011

View MapView Map

(Received 1 April 2007; accepted 4 July 2007; published online 16 August 2007)

Characteristic temperatures in ferromagnetic-antiferromagnetic exchange biased systems are analyzed. In addition to usual blocking temperature of exchange bias, TB, and the Néel temperature of an antiferromagnet, TN, the inducing temperature of exchange bias, Tind, has been recently proposed. Tind is the temperature at which the direction of exchange anisotropy is established. We demonstrate that this temperature is, in general, different from TB and TN. Measurements of Tind, in addition to TB and TN, provide important information about exchange interactions in ferromagnetic-antiferromagnetic heterostructures.

© 2007 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. THE PROCEDURE FOR MEASURING THE EXCHANGE BIAS INDUCING TEMPERATURE
  3. MODEL OF INTERACTIONS IN A FERROMAGNETIC-ANTIFERROMAGNETIC SYSTEM
  4. THE DISTINCTION BETWEEN INDUCING, BLOCKING, AND NéEL TEMPERATURES
  5. CONCLUSIONS

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS and PACS

PACS

  • 75.70.Cn

    Magnetic properties of interfaces (multilayers, superlattices, heterostructures)

  • 75.30.Et

    Exchange and superexchange interactions

  • 75.30.Kz

    Magnetic phase boundaries (including classical and quantum magnetic transitions, metamagnetism, etc.)

  • 75.30.Gw

    Magnetic anisotropy

ARTICLE DATA

PUBLICATION DATA

ISSN

0021-8979 (print)  
1089-7550 (online)

For access to fully linked references, you need to log in.
    W. H. Meiklejohn and C. P. Bean, Phys. Rev. 102, 1413 (1956)JAPIAU000033000003001328000001.

    A. N. Dobrynin et al., Appl. Phys. Lett. 87, 012501 (2005)APPLAB000087000001012501000001.

    M. S. Lund, W. A. A. Macedo, K. Liu, J. Nogués, I. K. Schuller, and C. Leighton, Phys. Rev. B 66, 054422 (2002).

    T. J. Moran, J. Nogués, D. Lederman, and I. K. Schuller, Appl. Phys. Lett. 72, 617 (1998)APPLAB000072000005000617000001.

    W. H. Meiklejohn, J. Appl. Phys. 33, 1328 (1962)JAPIAU000033000003001328000001.

    J. Nogués, D. Lederman, T. J. Moran, and I. K. Schuller, Phys. Rev. Lett. 76, 4624 (1996).

    J. Nogués, C. Leighton, and I. K. Schuller, Phys. Rev. B 61, 1315 (2000).

    A. N. Dobrynin et al., Phys. Rev. B 73, 245416 (2006).

    A. Hoffmann, Phys. Rev. Lett. 93, 097203 (2004).

    C. Leighton, J. Nogués, B. J. Jönsson-Åkerman, and I. K. Schuller, Phys. Rev. Lett. 84, 3466 (2000).

    A. Hoffmann, J. W. Seo, M. R. Fitzsimmons, H. Siegwart, J. Fompeyrine, J.-P. Locquet, J. A. Dura, and C. F. Majkrzak, Phys. Rev. B 66, 220406 (2002).

    P. Kappenberger, S. Martin, Y. Pellmont, H. J. Hug, J. Kortright, O. Hellwig, and E. Fullerton, Phys. Rev. Lett. 91, 267202 (2003).

    H. Ohldag, A. Scholl, F. Nolting, E. Arenholz, S. Maat, A. T. Young, M. Carey, and J. Stöhr, Phys. Rev. Lett. 91, 017203 (2003).

    K. Takano, R. H. Kodama, A. E. Berkowitz, W. Cao, and G. Thomas, Phys. Rev. Lett. 79, 1130 (1997).

    Y. Ijiri, J. Borchers, R. Erwin, S.-H. Lee, P. van der Zaag, and R. Wolf, Phys. Rev. Lett. 80, 608 (1998).

    N. C. Koon, Phys. Rev. Lett. 78, 4865 (1997).

    C. L. Chien, V. S. Gornakov, V. I. Nikitenko, A. J. Shapiro, and R. D. Shull, Phys. Rev. B 68, 014418 (2003).

    I. N. Krivorotov, C. Leighton, J. Nogués, I. K. Schuller, and E. Dan Dahlberg, Phys. Rev. B 68, 054430 (2003).

    M. S. Lund, M. R. Fritzsimmons, S. Park, and C. Leighton, Appl. Phys. Lett. 85, 2845 (2004)APPLAB000085000014002845000001.

    P. J. van der Zaag, Y. Ijiri, J. A. Borchers, L. F. Feiner, R. M. Wolf, J. M. Gaines, R. W. Erwin, and M. A. Verheijen, Phys. Rev. Lett. 84, 6102 (2000).

    C. Leighton, J. Nogués, H. Suhl, and I. K. Schuller, Phys. Rev. B 60, 12837 (1999).

    J. Nogués, D. Lederman, T. J. Moran, and I. K. Schuller, Appl. Phys. Lett. 68, 3186 (1996)APPLAB000068000022003186000001.

    S. Soeya, T. Imagawa, K. Mitsuoka, and S. Narishige, J. Appl. Phys. 76, 5356 (1994)JAPIAU000076000009005356000001.


For access to citing articles, you need to log in.


Figures (2)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)



Close
Google Calendar
ADVERTISEMENT

close