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Journal of Applied Physics / Volume 101 / Issue 3 / NANOSCALE SCIENCE AND DESIGN

J. Appl. Phys. 101, 034315 (2007); doi:10.1063/1.2434955 (5 pages)

Real time cantilever signal frequency determination using digital signal processing

Yu. Obukhov, K. C. Fong, D. Daughton, and P. C. Hammel

Department of Physics, The Ohio State University, Columbus, Ohio 43210

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(Received 11 July 2006; accepted 6 December 2006; published online 13 February 2007)

We describe a digital signal processing method for high precision frequency evaluation of approximately sinusoidal signals based on a computationally efficient method. We demonstrate frequency measurement enabling sensitive measurement of the oscillatory force exerted on a micromechanical cantilever. We apply this technique to detection of the force signal arising in a micromechanically detected magnetic resonance force microscopy electron spin resonance signal. Our frequency detection measurements agree well with the theoretical noise analysis presented here, and we find that due to the excellent sensitivity of optical displacement detection, our sensitivity is limited only by the thermal displacement noise of the cantilever.

© 2007 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. FREQUENCY EVALUATION FOR SINUSOIDAL SIGNALS
  3. FREQUENCY MEASUREMENT FOR NOISY SIGNALS
  4. IMPLEMENTATION OF FREQUENCY DETECTION SCHEME
  5. EXPERIMENTAL RESULTS
  6. CONCLUSION

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KEYWORDS and PACS

Keywords

signal processing, frequency estimation, micromechanical devices, cantilevers, electron microscopy, thermal noise, magnetic resonance spectroscopy, optical signal detection

PACS

  • 84.40.Ua

    Telecommunications: signal transmission and processing; communication satellites

ARTICLE DATA

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http://link.aip.org/link/doi/10.1063/1.2434955

PUBLICATION DATA

ISSN:

0021-8979 (print)  
1089-7550 (online)

Publisher:

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
    J. A. Sidles, J. L. Gaarbini, K. J. Bruland, D. Rugar, O. Zuger, S. Hoen, and C. S. Yannoni, Rev. Mod. Phys. 67, 249 (1995).

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    T. R. Albrecht, P. Grutter, D. Horne, and D. Rugar, J. Appl. Phys. 69, 668 (1991)JAPIAU000069000002000668000001.

    M. V. Salapaka, H. S. Bergh, J. Lai, A. Majumdar, and E. McFarland, J. Appl. Phys. 81, 2480 (1997)JAPIAU000081000006002480000001.


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