• Volume/Page
  • Keyword
  • DOI
  • Citation
  • Advanced
   
 
 
 

Flickr Twitter UniPHY Group iResearch App Facebook

J. Appl. Phys. 101, 023308 (2007); http://dx.doi.org/10.1063/1.2424532 (7 pages)

Analysis of electron interactions in dielectric gases

Aurelio Olivet, Daniel Duque, and Lourdes F. Vega

Institut de Ciència de Materials de Barcelona, Consejo Superior de Investigaciones Científicas (ICMAB-CSIC), Campus de la U.A.B., 08193 Bellaterra, Spain

View MapView Map

(Received 22 June 2006; accepted 3 November 2006; published online 25 January 2007)

We present and discuss results concerning electron interactions processes of dielectric gases and their relationship with the macroscopic behavior of these gases, in particular, with their dielectric strength. Such analysis is based on calculating energies of reactions for molecular ionization, dissociative ionization, parent negative ion formation, and dissociative electron attachment processes. We hypothesize that the estimation of the required energy for a reduced number of processes that take place in electrically stressed gases could be related to the gas’ capability to manage the electron flow during an electrical discharge. All calculations were done with semiempirical quantum chemistry methods, including an initial optimization of molecular geometry and heat of formation of the dielectric gases and all of species that appear during electron interaction reactions. The performance of semiempirical methods Austin model 1 and Parametric model 3 (PM3) was compared for several compounds, PM3 being superior in most cases. Calculations performed for a sample of nine dielectric gases show that electron attachment and detachment processes occur in different energy bands that do not overlap for any value of the dielectric strength. We have also analyzed the relationship between dielectric strength and two physical properties: electron affinity and ionization energy. Calculations performed for 43 dielectric gases show no clear correlation between them, although certain guidelines for the qualitative estimation of dielectric strength can still be assessed.

© 2007 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. METHODOLOGY
  3. RESULTS AND DISCUSSIONS
    1. Ionization energy and electron affinity
    2. Main electron interactions in electrically stressed gases
  4. CONCLUDING REMARKS

RELATED DATABASES

To view database links for this article, you need to log in.

KEYWORDS and PACS

PACS

ARTICLE DATA

PUBLICATION DATA

ISSN

0021-8979 (print)  
1089-7550 (online)

For access to fully linked references, you need to log in.
    P. J. Chantry and R. E. Wootton, J. Appl. Phys. 52, 2731 (1981)JAPIAU000052000004002731000001.

    J. P. Novak and M. F. Fréchette, J. Appl. Phys. 55, 107 (1984)JAPIAU000055000001000107000001.

    L. G. Christophorou, J. K. Olthoff, and M. V. V. S. Rao, J. Phys. Chem. Ref. Data 25, 1341 (1996)JPCRBU000025000005001341000001.

    L. G. Christophorou, J. K. Olthoff, and M. V. V. S. Rao, J. Phys. Chem. Ref. Data 26, 1 (1997)JPCRBU000026000001000001000001.

    L. G. Christophorou, J. K. Olthoff, and Yicheng Wang, J. Phys. Chem. Ref. Data 26, 1205 (1997).

    L. G. Christophorou and J. K. Olthoff, J. Phys. Chem. Ref. Data 27, 1 (1998)JPCRBU000027000001000001000001.

    L. G. Christophorou and J. K. Olthoff, J. Phys. Chem. Ref. Data 27, 889 (1998).

    L. G. Christophorou and J. K. Olthoff, J. Phys. Chem. Ref. Data 28, 131 (1999)JPCRBU000028000001000131000001.

    L. G. Christophorou and J. K. Olthoff, J. Phys. Chem. Ref. Data 28, 967 (1999)JPCRBU000028000004000967000001.

    L. G. Christophorou and J. K. Olthoff, J. Phys. Chem. Ref. Data 29, 267 (2000)JPCRBU000029000003000267000001.

    L. G. Christophorou and J. K. Olthoff, J. Phys. Chem. Ref. Data 29, 553 (2000)JPCRBU000029000004000553000001.

    L. G. Christophorou and J. K. Olthoff, J. Phys. Chem. Ref. Data 30, 449 (2001)JPCRBU000030000002000449000001.

    L. G. Christophorou and J. K. Olthoff, J. Phys. Chem. Ref. Data 31, 971 (2002)JPCRBU000031000004000971000001.


Figures (4) Tables (10)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)

Access to article objects (figures, tables, multimedia) requires a subscription; log in to view available files.
(Access to supplementary files, where available, is free for this journal.)



Close
Google Calendar
ADVERTISEMENT

close