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J. Appl. Phys. 100, 114325 (2006); http://dx.doi.org/10.1063/1.2400722 (6 pages)

Field-emission properties of ultrathin 5 nm tungsten nanowire

K. S. Yeong and J. T. L. Thong

Department of Electrical and Computer Engineering, National University of Singapore, 4 Engineering Drive 3, Singapore 117576, Singapore

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(Received 9 June 2006; accepted 28 September 2006; published online 14 December 2006)

We report the field-emission properties of ultrathin tungsten nanowires of 5 nm diameter and several hundred nanometer length. Fowler-Nordheim plots of field-emission current-voltage measurements of such nanowires show marked deviation from linearity. After flashing, cold-field-emission current stability with standard deviation of better than 1% has been observed for periods of at least 30 min at a vacuum level of 10−9 mbar. Beyond this, field-emission current noise was found to mainly comprise current step jumps and current spikes. At high emission current densities in the order of 106A cm−2, the noise changes into flicker noise. Field emission at high current density induced surface diffusion and crystallization of the disordered nanowire tip due to temperature rise at the field-emitting tip. Further increase in the emission current density initiated local arc destruction which caused shortening of the nanowire length.

© 2006 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. EXPERIMENT
  3. RESULTS AND DISCUSSIONS
    1. Fowler-Nordheim plot
    2. Emission current stability
    3. Initiation of flicker noise and surface dynamics
    4. Crystallization of nanowire tip
    5. Nanowire shortening at high current densities
  4. CONCLUSIONS

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KEYWORDS and PACS

PACS

  • 79.70.+q

    Field emission, ionization, evaporation, and desorption

  • 73.63.Nm

    Quantum wires

  • 61.46.-w

    Structure of nanoscale materials

  • 68.65.La

    Quantum wires (patterned in quantum wells)

  • 68.35.Fx

    Diffusion; interface formation

  • 64.70.K-

    Solid-solid transitions

ARTICLE DATA

PUBLICATION DATA

ISSN

0021-8979 (print)  
1089-7550 (online)

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