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Journal of Applied Physics / Volume 108 / Issue 2 / ARTICLES / Lasers, Optics, and Optoelectronics

J. Appl. Phys. 108, 023106 (2010); http://dx.doi.org/10.1063/1.3462438 (6 pages)

Experimental aspects of multiharmonic-order coherent diffractive imaging

Sven Teichmann1, Bo Chen2, Ruben A. Dilanian2, Peter Hannaford1, and Lap Van Dao1

1ARC Centre of Excellence for Coherent X-Ray Science, Centre for Atom Optics and Ultrafast Spectroscopy, Swinburne University of Technology, Melbourne 3122, Australia
2ARC Centre of Excellence for Coherent X-Ray Science, School of Physics, The University of Melbourne, Melbourne 3010, Australia

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(Received 21 April 2010; accepted 9 June 2010; published online 26 July 2010)

We describe some experimental aspects required for the implementation of a few-order high-harmonic source for coherent diffractive imaging in the extreme-ultraviolet region. Polychromatic high-angle diffractive images have been successfully processed for both periodic and aperiodic inorganic samples using a modified Gerchberg–Saxton algorithm and maximum-entropy-method refinement and reconstructions yielding a resolution of 100 nm can now be achieved at harmonic wavelengths around 32 nm.

© 2010 American Institute of Physics

Article Outline

  1. INTRODUCTION
  2. GENERATION OF ONLY A FEW HIGH-HARMONIC ORDERS
  3. POLYCHROMATIC COHERENT DIFFRACTIVE IMAGING
    1. High-dynamic range diffractive imaging
    2. Diffractive imaging of a periodic sample
    3. Diffractive imaging of an aperiodic sample
    4. Diffractive imaging of a composite sample consisting of a pinhole and a microscopic periodic sample
    5. Effect of pinholes on diffractive images
  4. CONCLUSIONS

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KEYWORDS and PACS

Keywords

image reconstruction, light diffraction, maximum entropy methods, optical harmonic generation

PACS

  • 42.65.Ky

    Frequency conversion; harmonic generation, including higher-order harmonic generation

  • 42.30.Wb

    Image reconstruction; tomography

  • 42.30.Va

    Image forming and processing

  • 42.25.Fx

    Diffraction and scattering

ARTICLE DATA

Digital Object Identifier
http://dx.doi.org/10.1063/1.3462438

PUBLICATION DATA

ISSN

0021-8979 (print)  
1089-7550 (online)

Publisher

$abstract.society.value is a Member of CrossRef American Institute of Physics

For access to fully linked references, you need to log in.
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    J. Miao, T. Ishikawa, B. Johnson, E. H. Anderson, B. Lai, and K. O. Hodgson, Phys. Rev. Lett. 89, 088303 (2002).

    G. J. Williams, H. M. Quiney, B. B. Dhal, C. Q. Tran, K. A. Nugent, A. G. Peele, D. Paterson, and M. D. de Jonge, Phys. Rev. Lett. 97, 025506 (2006).

    C. G. Schroer, P. Boye, J. M. Feldkamp, J. Patommel, A. Schropp, A. Schwab, S. Stephan, M. Burghammer, S. Schöder, and C. Riekel, Phys. Rev. Lett. 101, 090801 (2008).

    B. Chen, R. D. Dilanian, S. Teichmann, B. Abbey, A. G. Peele, G. J. Williams, P. Hannaford, L. Van Dao, H. M. Quiney, and K. A. Nugent, Phys. Rev. A 79, 023809 (2009).

    R. A. Dilanian, B. Chen, G. J. Williams, H. M. Quiney, K. A. Nugent, S. Teichmann, P. Hannaford, L. Van Dao, and A. G. Peele, J. Appl. Phys. 106, 023110 (2009)JAPIAU000106000002023110000001.

    L. Van Dao, S. Teichmann, J. Davis, and P. Hannaford, J. Appl. Phys. 104, 023105 (2008)JAPIAU000104000002023105000001.

    S. Teichmann, P. Hannaford, and L. Van Dao, Appl. Phys. Lett. 94, 171111 (2009)APPLAB000094000017171111000001.


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