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Special Topic Section: Invited Papers from the International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials

PFM Editors Interview (MP3)

We are pleased to announce the publication of a new special topic section, Invited Papers from the International Symposium on Piezoelectric Force Microscopy and Nanoscale Phenomena in Polar Materials, in the 15 August issue of the journal.

The symposium was held in Aveiro, Portugal in June 2009 and comprised a set of tutorials on fundamentals of piezoelectric force microscope (PFM) operation, relevant instrumental details, and image and piezohysteresis interpretation, as well as presenting experimental work from ferroelectric laboratories worldwide equipped with modern PFM setups.

Listen to an introduction to the special topic section by Guest Editor Sergei V. Kalinin (MP3).

 

Highlighted Articles from the Special Topic Section:

http://www.aip.org/images/emails/jap9-2010-1.jpgPiezoresponse force microscopy investigations of Aurivillius phase thin films
Lynette Keeney, Panfeng F. Zhang, Claudia Groh, Martyn E. Pemble, and Roger W. Whatmore

The electromechanical responses of the materials were investigated using piezoresponse force microscopy and the results are discussed in relation to the crystallinity of the films as measured by x-ray diffraction.
 J. Appl. Phys. 108, 042004 (2010)

 

 

 

 

http://www.aip.org/images/emails/jap9-2010-2.gifLateral piezoelectric response across ferroelectric domain walls in thin films
J. Guyonnet, H. Béa, and P. Paruch

We attribute lateral piezoresponse at domain walls to their sideways motion (shear) under the applied electric field. From simple elastic considerations and the conservation of volume of the unit cell, we would expect a similar lateral signal more generally in other ferroelectric materials, and for all types of domain walls in which the out-of-plane component of the polarization is reversed through the domain wall.
J. Appl. Phys. 108, 042002 (2010)

 

http://www.aip.org/images/emails/jap9-2010-3.gifCorrelation of electron backscatter diffraction and piezoresponse force microscopy for the nanoscale characterization of ferroelectric domains in polycrystalline lead zirconate titanate
T. L. Burnett, P. M. Weaver, J. F. Blackburn, M. Stewart, and M. G. Cain

We show how, by combining textural analysis, through electron backscattered diffraction, with piezoresponse force microscopy, quantitative measurements of the piezoelectric properties can be made at a scale of 25 nm, smaller than the domain size. The results offer insight into the science of domain engineering and provide a tool for the future development of new nanostructured ferroelectric materials for memory, nanoactuators, and sensors based on magnetoelectric multiferroics.
 J. Appl. Phys. 108, 042001 (2010)

 

 


 

Table of Contents for the JAP Special Topic Section: Invited Papers from the International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, Aveiro, Portugal, 2009:

 

Preface to Special Topic: Invited Papers from the International Symposium on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, Aveiro, Portugal, 2009
Sergei V. Kalinin, Nava Setter, and Andrei L. Kholkin
J. Appl. Phys. 108, 041901 (2010)

Correlation of electron backscatter diffraction and piezoresponse force microscopy for the nanoscale characterization of ferroelectric domains in polycrystalline lead zirconate titanate
T. L. Burnett, P. M. Weaver, J. F. Blackburn, M. Stewart, and M. G. Cain
J. Appl. Phys. 108, 042001 (2010)

Lateral piezoelectric response across ferroelectric domain walls in thin films
J. Guyonnet, H. Béa, and P. Paruch
J. Appl. Phys. 108, 042002 (2010)

Drive frequency dependent phase imaging in piezoresponse force microscopy
Huifeng Bo, Yi Kan, Xiaomei Lu, Yunfei Liu, Song Peng, Xiaofei Wang, Wei Cai, Ruoshi Xue, and Jinsong Zhu
J. Appl. Phys. 108, 042003 (2010)

Piezoresponse force microscopy investigations of Aurivillius phase thin films
Lynette Keeney, Panfeng F. Zhang, Claudia Groh, Martyn E. Pemble, and Roger W. Whatmore
J. Appl. Phys. 108, 042004 (2010)

Individual switching of film-based nanoscale epitaxial ferroelectric capacitors
Yunseok Kim, Hee Han, Brian J. Rodriguez, Ionela Vrejoiu, Woo Lee, Sunggi Baik, Dietrich Hesse, and Marin Alexe
J. Appl. Phys. 108, 042005 (2010)

Real space mapping of polarization dynamics and hysteresis loop formation in relaxor-ferroelectric PbMg1/3Nb2/3O3–PbTiO3 solid solutions
B. J. Rodriguez, S. Jesse, A. N. Morozovska, S. V. Svechnikov, D. A. Kiselev, A. L. Kholkin, A. A. Bokov, Z.-G. Ye, and S. V. Kalinin
J. Appl. Phys. 108, 042006 (2010)

Investigation of the ferroelectric-relaxor transition in PbMg1/3Nb2/3O3–PbTiO3 ceramics by piezoresponse force microscopy
V. V. Shvartsman and A. L. Kholkin
J. Appl. Phys. 108, 042007 (2010)

Analysis of the degradation induced by focused ion Ga3+ beam for the realization of piezoelectric nanostructures
D. Rémiens, R. H. Liang, C. Soyer, D. Deresmes, D. Troadec, S. Quignon, A. Da Costa, and R. Desfeux
J. Appl. Phys. 108, 042008 (2010)

Pyroelectric response of ferroelectric nanowires: Size effect and electric energy harvesting
A. N. Morozovska, E. A. Eliseev, G. S. Svechnikov, and S. V. Kalinin
J. Appl. Phys. 108, 042009 (2010)

Ferroelectric microdomains and microdomain arrays recorded in strontium–barium niobate crystals in the field of atomic force microscope
Tatiana R. Volk, Liliya V. Simagina, Radmir V. Gainutdinov, Alla L. Tolstikhina, and Lyudmila I. Ivleva
J. Appl. Phys. 108, 042010 (2010)

Piezoresponse force microscopy studies of the triglycine sulfate-based nanofibers
D. V. Isakov, E. de Matos Gomes, B. G. Almeida, I. K. Bdikin, A. M. Martins, and A. L. Kholkin
J. Appl. Phys. 108, 042011

Local probing of magnetoelectric coupling in multiferroic composites of BaFe12O19–BaTiO3
D. V. Karpinsky, R. C. Pullar, Y. K. Fetisov, K. E. Kamentsev, and A. L. Kholkin
J. Appl. Phys. 108, 042012 (2010)

 


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